Single Wafer Test and Burn-in Solutions
Product Details
| Application | Memory & logic, automotive, flash cycling, devices with BIST, DFT & Scan, silicon photonics |
|---|---|
| Wafer-level Burn-in | HTOL, HTRB, HTGB testing, long-term system stability and robustness for 1000+ hours of test time, high precision individual device monitoring |
Supplier Info
AEHR Test Systems Philippines, Inc.
Berthaphil III, Office Center, Clark Center, 8 A-E Jose Abad Santos Ave., Clark Freeport Zone, Angeles City, Pampanga
Product Description
The FOX-CP is a single wafer, single touchdown burn-in and test solution for high volume production.
- Lowest test cost per wafer, as more tests move from packaged parts to wafers for stacked die applications
- Industry first Universal Channel Architecture where any channel supports I/O, Power Supply, Clock, PPMU functionality – thousands of resources available for full-wafer testing
- Supports production burn-in screening, and HTOL, HTRB, HTGB qualification testing
- Optimized for DFT, BIST, and high parallelism
- Proven applications include: Full wafer functional, stress, and burn-in test of automotive ICs; low cost full wafer test of discrete or embedded memories
Product Reviews
From The Same Supplier
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Single Wafer Test and Burn-in Solutions
by AEHR Test Systems Philippines, Inc.The FOX-CP is a single wafer, single touchdown burn-in and test solution for high volume production.